Yeh, David

2017 Distinguished Alumni Award

For guidance and support of university research and teaching to meet technological challenges of the semiconductor industry

A Texas Instruments assignee at the Semiconductor Research Corporation, David Yeh manages and directs three research programs: system-level design, computer-aided design and test, and analog/mixed-signal circuits, systems, and devices. As the senior director in the Global Research Collaboration, he supports university research programs, addressing highspeed, low-power, robustness and manufacturability issues in the design and testing of integrated circuits for digital, analog, mixed-signal, and RF products. In this capacity, he helps SRC members implement research projects supporting continued CMOS scaling, as well as expanding design research to include analog, mixed-signal, RF, and mm-wave topics. Since 2005, he has put various programs in place on behalf of SRC members, including the Texas Analog Center of Excellence (TxACE) and two joint solicitations between SRC and the National Science Foundation titled “Multi-core Chip Design and Architecture” and “Failure-Resistant System.”

At Texas Instruments, Yeh has made significant contributions to the planning, development, support, and enhancement of TISpice3, an internal circuit simulation tool with best-in-class features that was in use for more than 20 years. He was their representative to SRC’s Computer Aided Design and Test Sciences (CADTS) area, serving as that group’s Science Area Coordinating Committee Chairman for two years. He is also a Senior Member of IEEE and served on the ECE ILLINOIS Alumni Board for many years.