ECE 451

• Electromagnetics, Optics and Remote Sensing

To have the student able to assemble, program, and utilize sophisticated automated microwave measurement systems, with an appreciation for the capabilities and the limitations of the microwave measurements and of the automated system.

• Descriptive parameters at microwave frequencies
• Measurement instruments and systems
• Computer-controlled instrumentation
• Accuracy enhancement techniques
• Packaging and signal integrity techniques
• High-speed probing and fixturing techniques
• Nonlinear measurements at microwave frequencies

To have the student able to assemble, program, and utilize sophisticated automated microwave measurement systems, with an appreciation for the capabilities and the limitations of the microwave measurements and of the automated system.

Topics:

• Descriptive parameters at microwave frequencies
• Measurement instruments and systems
• Computer-controlled instrumentation
• Accuracy enhancement techniques
• Packaging techniques
• High-speed probing and fixturing techniques

Error correction for accuracy-enhanced measurement is performed using Keysight-ADS and RMB on workstations. Data acquisition and network optimization are achieved through the controllers.

Experiment No. 01 - Detecting RF Power - Introduction to BenchVue for Automated Measurement
Experiment No. 02 - Slotted-line Measurements
Experiment No. 03 - Automated Scalar Reflectometry
Experiment No. 04 - Network Analyzer Error Corrections
Experiment No. 05 - PNA and TDR
Experiment No. 06 - Extraction of TL Parameters
Experiment No. 07 - Probe Station Wafer Tests and Eye Diagram Analysis
Experiment No. 08 - TRL Calibration Method
Experiment No. 09 - Advanced Techniques
Experiment No. 10 - Linear Vector Network Analyzer Measurements of Amplifiers
Experiment No. 11 - Generating X-Parameters via Simulation
Experiment No. 12 - Measuring X-Parameters Using a Nonlinear Vector Network Analyzer

High-Frequency sources

Performance Network Analyzers

X-Parameter Network Analyzer

High-Frequency Probe Station

Slotted Lines

Keysight ADS

Ansys HFSS

ECE 329

M. Steer, Microwave and RF Design, 2^nd Edition, SciTech Publishing, 2013.

ECE 447

ECE 453

Engineering Science: 1 1/2 credits or 50%
Engineering Design: 1 1/2 credits or 50%

This course introduces senior and graduate students to the fundamentals of high-frequency measurements and the latest techniques for accuracy-enhanced automated microwave measurements. The goal of the course is to provide the special training necessary in high-frequency and high-speed measurements. Computers are used to model, control and remove parts of the systematic errors in the measuring systems.

A. By midterm (after 13 lectures and 7 lab sessions), the students should be able to do the following:

1. Calibrate and characterize a crystal detector for square-law operation (6).

2. Perform complex impedance measurements on a slotted line by measurement of the VSWR and wave profile on the slotted line (1, 6, 7).

3. Perform swept-frequency scalar reflectometry measurements using directional couplers (6).

4. Evaluate imperfections of interconnects and transmission lines (1,6,7).

5. Use scattering parameters and flow graph techniques. Use Mason's rule to calculate transfer functions (1, 7).

6. Understand high-speed and high-frequency issues and their relevance in microwave measurements (1, 7).

7. Understand the functional blocks involved in microwave measurements such as test sets, couplers, harmonic converters and other components (6).

B. By the time of the Final Exam (after 26 lectures and 14 lab sessions), the students should be able to do all of the items listed under A, plus the following:

8. Perform manual measurements on a scalar network analyzer and complex measurements on a vector voltmeter (6, 7).

9. Perform manual magnitude and phase measurements on a vector network analyzer. Understand the role of calibration standards (6, 7).

10. Control instruments such as sources, voltmeters via the HPIB bus from a computer using Agilent Vee and National Instrument Labview (1, 7).

11. Perform automated scalar reflectometry measurements (1, 6).

12. Use one-, two-, and three-term error models to remove errors from reflectometer measurements. This permits the accurate complex determination of a complex unknown (1, 6, 7).

13. Use the automated network analyzers. These are the Performance Network Analyzer (PNA) series: E8358A, E8363B. Use the time-domain option on the E8363B to perform TDR measurements (1, 6, 7).

14. Perform Eye diagram simulations and measurements (1, 6, 7).

15. Learn about advanced calibration techniques such as the 8-term and 12-term error models (1, 6, 7).

16. Perform thru-reflect-line (TRL) calibrations for more accurate measurements (1, 6, 7).

17. Perform on-wafer measurements using a microwave probe station (6).