ECE 582
ECE 582 - Physical VLSI Design
Spring 2012
| Title | Rubric | Section | CRN | Type | Hours | Times | Days | Location | Instructor |
|---|---|---|---|---|---|---|---|---|---|
| Physical VLSI Design | ECE582 | N | 34008 | LCD | 4 | 0930 - 1050 | T R | 143 Everitt Laboratory | Martin D F Wong |
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Official Description
Basic physical design requirements for VLSI; performance-oriented formulation and optimization of chip partitioning, module placement and interconnection; optimized design and layout of on-chip modules; circuit extraction; high-speed VLSI circuits; yield and reliability analysis; advanced VLSI packaging and parametric testing. Course Information: Prerequisite: ECE 425 or ECE 482.
Subject Area
- Integrated Circuits and Systems
Course Director
Description
Basic physical design requirements for VLSI; performance-oriented formulation and optimization of chip partitioning, module placement and interconnection; optimized design and layout of on-chip modules; circuit extraction; high-speed VLSI circuits; yield and reliability analysis; advanced VLSI packaging and parametric testing.
Topics
- Basic physical design requirements for VLSI: technology; chip performance and cost; technology updateability; reliability
- Physical design methodologies: algorithms in logic partitioning placement and routing interconnection parasitics and delays
- Optimization problems in module generation
- Modeling and extraction of circuit parameters from physical layout
- High-speed VLSI circuits
- Circuit optimization for yield and reliability
- Wafer-scale integration
- Advanced VLSI packaging and parametric testing
Detailed Description and Outline
Topics:
- Basic physical design requirements for VLSI: technology; chip performance and cost; technology updateability; reliability
- Physical design methodologies: algorithms in logic partitioning placement and routing interconnection parasitics and delays
- Optimization problems in module generation
- Modeling and extraction of circuit parameters from physical layout
- High-speed VLSI circuits
- Circuit optimization for yield and reliability
- Wafer-scale integration
- Advanced VLSI packaging and parametric testing
Texts
Class notes, recent papers.
Collateral Reading:
T.C. Hu and E.S. Kuh, Eds., VLSI Circuit Layout: Theory and Design, IEEE Press, 1985.
M. Shoji, CMOS Digital Circuit Technology, Prentice-Hall, 1987.
S.M. Sze, Ed., VLSI Technology, McGraw-Hill, 1983.
Collateral Reading:
T.C. Hu and E.S. Kuh, Eds., VLSI Circuit Layout: Theory and Design, IEEE Press, 1985.
M. Shoji, CMOS Digital Circuit Technology, Prentice-Hall, 1987.
S.M. Sze, Ed., VLSI Technology, McGraw-Hill, 1983.
Last updated
2/13/2013