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Distinguished Lecture Series: IEEE CEDA Central Illinois Chapter featuring Dr. Elyse Rosenbaum

Originating Calendar ECE ILLINOIS Seminars
Speaker Dr. Elyse Rosenbaum, Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering
Date: 12/6/2018
Time: 2 p.m.

CSL B02 (Auditorium )


IEEE CEDA Central Illinois Chapter

Event Type: Seminar/Symposium

The term predictive simulation describes a scenario in which one wishes predict the response of the subject to previously unexperienced stimuli or loads. The model of the subject may be behavioral or physical. The former is derived by observing the response of the subject to various stimuli, either in the laboratory or in a physical simulation. In theory, a physical model can be constructed in the absence of measurement data but, more often, engineers use physics-based models that are semi-empirical and require data for “tuning.” 

It might seem that behavioral models are worse suited for predictive simulation. I will argue that behavioral models can be constrained to replicate known physical behaviors. In general, designers trust the simulation results obtained using physical models. In this presentation, I will show several cases taken from the open literature in which that confidence was misplaced.

Elyse Rosenbaum is the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. She received the Ph.D. degree in electrical engineering from University of California, Berkeley. She is the director of the NSF-supported Center for Advanced Electronics through Machine Learning (CAEML), a joint project of the University of Illinois, Georgia Tech and North Carolina State University. Her current research interests include component and system-level ESD reliability, ESD-robust high-speed I/O circuit design, compact modeling, circuit reliability simulation, mitigation strategies for ESD-induced soft failures, and machine-learning aided behavioral modeling of microelectronic components and systems.

Dr. Rosenbaum has authored or co-authored nearly 200 technical papers; she has been an editor for IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Electron Devices. She was the recipient of a Best Student Paper Award from the IEDM, Outstanding and Best Paper Awards from the EOS/ESD Symposium, a Technical Excellence Award from the SRC, an NSF CAREER award, an IBM Faculty Award, and the ESD Association’s Industry Pioneer Recognition Award. She is a Fellow of the IEEE.

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